# Test Input Commands

CMSIS-DAP: Test Input Commands

| CMSIS-DAP Version 1.2.0 (Proposal) Interface Firmware for CoreSight Debug Access Port

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Test Input Commands
CMSIS-DAP Commands

Management commands for optional Test Inputs. More...

## Content

| DAP_TI_Info
| Get information about Test Input channel parameters of the CMSIS-DAP Debug Unit.
| DAP_TI_Value
| Get live data values from Test Input channels.
| DAP_TI_Capture
| Control continuous data recording of Test Input channels.
| DAP_TI_TransferBlock
| Transfer the data that are recorded for various Test Input channels.

## Description

Management commands for optional Test Inputs.

CMSIS-DAP provides a command set that allows to implement an optional Test Input (TI) management in the Debug Unit. Recording of up to 16 different Test Inputs is possible. Test Input values can be recorded as BYTE, SHORT, or WORD. The Debug Unit may include scaling parameters and dynamic ranges for a channel (for example a 14-bit value with a 2-bit range selection).

Test Inputs could be used for various scenarios, for example:

- capture power measurement from A/D converters.
- capture wait states or cache misses from a memory system.
- capture data transfer parameters of an RF interface.
- test input pins of a Debug Unit.

These Test Inputs can be recorded continuously with a specified trace recording frequency. The recording allows you to correlate the Test Input information with program execution. For recording of the CMSIS-DAP Firmware includes an optional Trace Data Management based on configurable memory blocks. This Trace Data Management also captures SWO trace information.

Note
  The Test Input Commands are only available when DAP_Info with ID=0xF0 (Capabilities) returns in Info - Bit 6: 1 = Trace Data Management.

Trace Data Management